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One key issue in characterization of organic solar cells with solution processed interfacial layers.

Authors :
Gao, Jinhua
An, Qiaoshi
Zhang, Miao
Miao, Jianli
Ma, Xiaoling
Hu, Zhenghao
Wang, Jianxiao
Zhang, Fujun
Source :
Physical Chemistry Chemical Physics (PCCP); 3/14/2019, Vol. 21 Issue 10, p5790-5795, 6p
Publication Year :
2019

Abstract

Solution processed interfacial layers are commonly employed in bulk heterojunction organic solar cells (OSCs) for better charge collection. PDIN interfacial layers were prepared by employing a static or dynamic spin coating method from PDIN methanol solution, and defined as the S-PDIN or D-PDIN layer. The OSCs with a S-PDIN layer exhibit 13.88% power conversion efficiency (PCE) with a virtual high short circuit density (J<subscript>SC</subscript>) of 26.45 mA cm<superscript>−2</superscript> and relatively low fill factor (FF) of 58.94% during the current density versus voltage (J–V) measurement without a shadow mask. 12.56% PCE is achieved for OSCs with a D-PDIN layer, along with a J<subscript>SC</subscript> of 18.85 mA cm<superscript>−2</superscript> and FF of 74.88%. Over 77% FFs are obtained for OSCs with a S-PDIN or D-PDIN layer during J–V measurement with a shadow mask, and both OSCs exhibit a very similar J<subscript>SC</subscript> and PCE. The virtual high J<subscript>SC</subscript>s and relatively low FF of OSCs with a S-PDIN layer may be due to the enhanced conductivity of PEDOT:PSS during preparation of the PDIN layer by the SSC method, which can be further confirmed from the OSCs with a methanol treated PEDOT:PSS layer. This work indicates that a well-balanced J<subscript>SC</subscript> and FF should be an important evaluating indicator for efficient OSCs, and an appropriate shadow mask is necessary to measure the J–V curves of OSCs with a solution processed interfacial layer. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14639076
Volume :
21
Issue :
10
Database :
Complementary Index
Journal :
Physical Chemistry Chemical Physics (PCCP)
Publication Type :
Academic Journal
Accession number :
135108155
Full Text :
https://doi.org/10.1039/c9cp00181f