Direct near-field antenna testing and fault diagnosis by a silicon-probe-based optical sensing technique.

A non-perturbing, fast, low-cost probe for near-field measurements is presented in this paper. The new sensing technique's capabilities in antenna fault diagnosis and direct measurement of field intensity distribution at subwavelength distance from the sources are demonstrated by test measurement on different microwave antennas and applicators. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 95–98, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10981 [ABSTRACT FROM AUTHOR]