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Novel microscopy‐based approaches to study the film formation mechanism and associated mechanical response in polymer lattices.

Authors :
TKACZYK, MARZENA
DRAGNEVSKI, KALIN I.
SIVIOUR, CLIVE R.
EDWARDS, GARY
Source :
Journal of Microscopy; Mar2019, Vol. 273 Issue 3, p163-168, 6p, 1 Color Photograph, 2 Black and White Photographs, 1 Diagram, 3 Graphs
Publication Year :
2019

Abstract

Summary: In this paper, we present the results from novel microscopy‐based approaches aimed at providing further insight into the mechanism of film formation and associated mechanical response in polymer lattices. Firstly, a 'simple' methodology, combining the use of variable pressure scanning electron microscopy and a recently introduced enhanced coolstage (–50 to +50°C), was successfully developed and not only used to study dynamic processes, e.g. different stages of latex film formation, but also for high‐resolution imaging of 'freeze‐dried' structures. By using the enhanced freeze‐drying capability of the system, it was also possible to preserve the structure and features of the studied system with minimum shrinkage and distortion and in the case of polymer lattices at a desired stage of film formation. Moreover, specimens can then be readily imaged, without the need of conductive coatings and at much lower chamber gas pressures, thus minimizing the beam skirting effects and allowing higher resolutions to be achieved. The second and final part of our study consider the mechanical response of the studied latex dried under different conditions, with the particular emphasis on the effects of drying rate [% relative humidity (RH)]. Atomic force microscopy force distance curve measurements revealed that while the %RH did not have an effect on the structures formed, it did have an effect on the adhesive properties of the studied system. It is strongly believed that the methodologies developed and used here can be applied to other material systems, including biologicals and pharmaceuticals. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00222720
Volume :
273
Issue :
3
Database :
Complementary Index
Journal :
Journal of Microscopy
Publication Type :
Academic Journal
Accession number :
134685739
Full Text :
https://doi.org/10.1111/jmi.12777