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Development of highly reliable ferroelectric random access memory and its Internet of Things applications.

Authors :
Takashi Eshita
Wensheng Wang
Kenji Nomura
Ko Nakamura
Hitoshi Saito
Hideshi Yamaguchi
Satoru Mihara
Yukinobu Hikosaka
Yuji Kataoka
Manabu Kojima
Source :
Japanese Journal of Applied Physics; Nov2018 Supplement, Vol. 57 Issue 11S, p1-1, 1p
Publication Year :
2018

Abstract

Ferroelectric random access memory (FRAM) has been commercialized for about 20 years and its reliability has been well proven all over the world. In the recent Internet of Things (IoT) era, it also plays important roles to particularly in edge computing because of its high writing speed, high rewriting endurance, and low writing energy consumption. We review the history of semiconductor memories using ferroelectrics and overview the progresses of the new ferroelectrics and promising ferroelectric applications in the future. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00214922
Volume :
57
Issue :
11S
Database :
Complementary Index
Journal :
Japanese Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
134570012
Full Text :
https://doi.org/10.7567/JJAP.57.11UA01