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Study of the depletion depth in a frontside biased CMOS pixel sensors.
- Source :
- Journal of Instrumentation; Jan2019, Vol. 14 Issue 1, p1-1, 1p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 17480221
- Volume :
- 14
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Journal of Instrumentation
- Publication Type :
- Academic Journal
- Accession number :
- 134435951
- Full Text :
- https://doi.org/10.1088/1748-0221/14/01/P01018