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Fast inside‐source X‐ray fluorescent holography.

Authors :
Bortel, G.
Faigel, G.
Tegze, M.
Angelov, B.
Source :
Journal of Synchrotron Radiation; Jan2019, Vol. 26 Issue 1, p170-174, 5p
Publication Year :
2019

Abstract

Atomic resolution X‐ray holography can be realized by using the atoms of the sample as inside sources or inside detectors. However, until now there were only very few experiments in which the atoms played the role of inside sources. The reason is twofold: (i) technically, inside‐detector experiments are much easier and faster; (ii) by using atoms as inside detectors one can measure holograms at many energies on the same sample, which helps the reconstruction. This paper shows that, using new technical developments, inside‐source holograms can be taken much faster than inside‐detector holograms and, by applying a sophisticated evaluation method, high‐quality reconstruction from a single‐energy hologram can also be obtained. An experimental demonstration of a fast inside‐source holography measurement and structure reconstruction is presented. This type of measurement provides a route to single‐pulse structure determination at X‐ray free‐electron lasers allowing strongly non‐ambient conditions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09090495
Volume :
26
Issue :
1
Database :
Complementary Index
Journal :
Journal of Synchrotron Radiation
Publication Type :
Academic Journal
Accession number :
134201009
Full Text :
https://doi.org/10.1107/S1600577518014686