Ternary photonic crystal with left-handed material layer for refractometric application.

Graphical abstract Highlights • Ternary photonic crystal layer is examined for refractometric applications. • One of the layers is assumed to left-handed material (LHM). • The transmission spectrum is studied and found to exhibit a transmission peak. • The peak shift due to any change in the index of the analyte is investigated. • The peak shift can be enhanced with the change of the LHM parameters. Abstract A ternary photonic crystal with left-handed material (LHM) layer is examined for refractometric applications. One of the layers is assumed to be air and treated as an analyte. The transmittance from the ternary photonic crystal is studied in details and the wavelength shift due to the change in the refractive index of the analyte is investigated. The transmittance is investigated with the parameters of the LHM. It is found that the wavelength shift can be significantly enhanced with the decrease of both real part of the LHM permittivity and thickness. [ABSTRACT FROM AUTHOR]