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Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires.
- Source :
- Nanoscale; 11/7/2018, Vol. 10 Issue 41, p19443-19449, 7p
- Publication Year :
- 2018
Details
- Language :
- English
- ISSN :
- 20403364
- Volume :
- 10
- Issue :
- 41
- Database :
- Complementary Index
- Journal :
- Nanoscale
- Publication Type :
- Academic Journal
- Accession number :
- 132600290
- Full Text :
- https://doi.org/10.1039/c8nr05296d