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Thickness dependence of photoresponsive properties at SrTiO3-based oxide heterointerfaces under different strains.

Authors :
Yan, Hong
Zhang, Zhaoting
Wang, Shuanhu
Ren, Lixia
Li, Ming
Chen, Changle
Jin, Kexin
Source :
Journal of Materials Science; Jan2019, Vol. 54 Issue 1, p108-115, 8p, 2 Diagrams, 3 Graphs
Publication Year :
2019

Abstract

The photoresponsive characteristics of SrTiO<subscript>3</subscript>-based oxide heterointerfaces at different thicknesses and strains are investigated. In addition to the typical persistent photoconductivity, the transient photoconductivity is observed at the heterointerfaces below the critical thickness. More intriguingly, it shows a transition from the transient photoconductivity to the persistent photoconductivity for the interfaces at the critical thickness with enhancing temperatures, which is related to the dominant role of thermal energy. Moreover, larger strain at the LaAlO<subscript>3</subscript>/SrTiO<subscript>3</subscript> interfaces produces a roughly greater photoinduced change in the resistance than the strain-relaxed (La<subscript>0.3</subscript>Sr<subscript>0.7</subscript>)(Al<subscript>0.65</subscript>Ta<subscript>0.35</subscript>)O<subscript>3</subscript>/SrTiO<subscript>3</subscript> interfaces. Our results provide deeper insight into the photoresponsive properties and intrinsic mechanisms of two-dimensional electron gas at complex oxide interfaces. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00222461
Volume :
54
Issue :
1
Database :
Complementary Index
Journal :
Journal of Materials Science
Publication Type :
Academic Journal
Accession number :
132400512
Full Text :
https://doi.org/10.1007/s10853-018-2823-1