Cite
Total-Ionizing-Dose Effects on Al/SiO2 Bimorph Electrothermal Microscanners.
MLA
Liao, Wenjun, et al. “Total-Ionizing-Dose Effects on Al/SiO2 Bimorph Electrothermal Microscanners.” IEEE Transactions on Nuclear Science, vol. 65, no. 8, Aug. 2018, pp. 2260–67. EBSCOhost, https://doi.org/10.1109/TNS.2018.2853139.
APA
Liao, W., Zhang, E. X., Alles, M. L., Sternberg, A. L., Arutt, C. N., Wang, D., Zhao, S. E., Wang, P., McCurdy, M. W., Xie, H., Fleetwood, D. M., Reed, R. A., & Schrimpf, R. D. (2018). Total-Ionizing-Dose Effects on Al/SiO2 Bimorph Electrothermal Microscanners. IEEE Transactions on Nuclear Science, 65(8), 2260–2267. https://doi.org/10.1109/TNS.2018.2853139
Chicago
Liao, Wenjun, En Xia Zhang, Michael L. Alles, Andrew L. Sternberg, Charles N. Arutt, Dingkang Wang, Simeng E. Zhao, et al. 2018. “Total-Ionizing-Dose Effects on Al/SiO2 Bimorph Electrothermal Microscanners.” IEEE Transactions on Nuclear Science 65 (8): 2260–67. doi:10.1109/TNS.2018.2853139.