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Dynamic evolution of photogenerated carriers at complex oxide heterointerfaces.

Authors :
Yan, H.
Wang, S. H.
Zhang, Z. T.
Zhang, H. R.
Chen, C. L.
Jin, K. X.
Source :
Journal of Applied Physics; 2018, Vol. 124 Issue 3, pN.PAG-N.PAG, 6p, 4 Graphs
Publication Year :
2018

Abstract

Heterointerfaces between two insulators play a central role in the study of oxide electronics owing to a spectrum of emergent properties. Manipulating transport of the interface by light can result in significant modulation of the ground state and excite localized states. However, their dynamics and mechanisms of photogenerated carries remain unclear. Here, this study presents the dynamics of carrier density and mobility under and after light illumination by Hall effect over time. It is discovered that the density and mobility after light illumination obey a stretched exponential expression, further indicating that the variation of mobility caused by the electron-electron scattering plays an important role in the recovery process in addition to the reduction of carrier density. Meanwhile, a non-linear Hall resistance at the LaAlO<subscript>3</subscript>/SrTiO<subscript>3</subscript> interface under the illumination of a 360 nm laser at low temperature is observed. Furthermore, the gating effect can tune the recovery process after light illumination and induce a disappearance of non-linear Hall resistance. The results provide the experimental support for detailed mechanisms of the nonequilibrium process and developing of all-oxide electronic devices based on heterointerfaces. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
124
Issue :
3
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
130857337
Full Text :
https://doi.org/10.1063/1.5038392