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Effect of thermal annealing on crystal structures and electrical properties in BaTiO3 ceramics.

Authors :
Khanal, Gopal Prasad
Kim, Sangwook
Fujii, Ichiro
Ueno, Shintaro
Moriyoshi, Chikako
Kuroiwa, Yoshihiro
Wada, Satoshi
Source :
Journal of Applied Physics; 2018, Vol. 124 Issue 3, pN.PAG-N.PAG, 8p, 6 Graphs
Publication Year :
2018

Abstract

Mechanical damage and stress caused by polishing and cutting of ferroelectric materials could deteriorate their dielectric, ferroelectric, and piezoelectric properties. BaTiO<subscript>3</subscript> piezoelectric ceramics were polished and cut, and thermally annealed at 600, 800, 1000, and 1200 °C for recovery. The electrical measurements revealed a reduction in the coercive field, elimination of imprint behavior, and an increase in saturation polarization in the thermally annealed ceramics. Furthermore, the electromechanical properties measured by the resonance method, prior to thermal annealing were d<subscript>33</subscript> = 184 pC/N, k<subscript>33</subscript> = 0.36, and s<subscript>33</subscript><superscript>E</superscript> = 10.9 × 10<superscript>−12</superscript> m<superscript>2</superscript>/N, while the values after 1200 °C-4 h thermal annealing were d<subscript>33</subscript> = 287 pC/N, k<subscript>33</subscript> = 0.54, and s<subscript>33</subscript><superscript>E</superscript> = 12.1 × 10<superscript>−12</superscript> m<superscript>2</superscript>/N. The in situ crystal structure evaluation and Williamson-Hall analysis suggested the decrement of microstrain from 6.38 × 10<superscript>−4</superscript> to 5.20 × 10<superscript>−4</superscript>, indicating the retrieval of the residual stress imposed. The enhancement of piezoelectricity by 56% was ascribed to the effective annealing out of the surface mechanical damaged layers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
124
Issue :
3
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
130857317
Full Text :
https://doi.org/10.1063/1.5023814