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2D tungsten diselenide analyzed by XPS.

Authors :
Shallenberger, Jeffrey R.
Source :
Surface Science Spectra; 2018, Vol. 25 Issue 1, pN.PAG-N.PAG, 8p
Publication Year :
2018

Abstract

Tungsten diselenide (WSe<subscript>2</subscript>) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, W 4d, W 4f, W 5p, Se 3d and an extended region encompassing Se 3p, Se 3s, W 4d, Se LMM, and C 1s were acquired along with the valence band. Bulk quantitative analyses by x-ray fluorescence and x-ray diffraction indicated the material was stoichiometric and phase pure, respectively. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10555269
Volume :
25
Issue :
1
Database :
Complementary Index
Journal :
Surface Science Spectra
Publication Type :
Academic Journal
Accession number :
130767753
Full Text :
https://doi.org/10.1116/1.5016189