Investigation of phase transition properties of ZrO2 thin films.

This paper presents the synthesis of transparent thin films of zirconium oxide (ZrO₂) deposited on glass substrates by sol-gel dip coating technique. Synthesized films were characterized for different annealing time and withdrawal speed. Change in crystallographic properties of thin films was investigated by using X-ray diffraction. Surface morphology of transparent thin films was estimated by using scanning electron microscope. [ABSTRACT FROM AUTHOR]