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Hydrogenated Nano-/Micro-Crystalline Silicon Thin-Films for Thermoelectrics.

Authors :
Acosta, E.
Wight, N. M.
Smirnov, V.
Buckman, J.
Bennett, N. S.
Source :
Journal of Electronic Materials; Jun2018, Vol. 47 Issue 6, p3077-3084, 8p
Publication Year :
2018

Abstract

Thermoelectric technology has not yet been able to reach full-scale market penetration partly because most commercial materials employed are scarce/costly, environmentally unfriendly and in addition provide low conversion efficiency. The necessity to tackle some of these hurdles leads us to investigate the suitability of <italic>n</italic>-type hydrogenated microcrystalline silicon (μc-Si: H) in the fabrication of thermoelectric devices, produced by plasma enhanced chemical vapour deposition (PECVD), which is a mature process of proven scalability. This study reports an approach to optimise the thermoelectric power factor (PF) by varying the dopant concentration by means of post-annealing without impacting film morphology, at least for temperatures below 550°C. Results show an improvement in PF of more than 80%, which is driven by a noticeable increase of carrier mobility and Seebeck coefficient in spite of a reduction in carrier concentration. A PF of 2.08 × 10<superscript>−4</superscript> W/mK<superscript>2</superscript> at room temperature is reported for <italic>n</italic>-type films of 1 μm thickness, which is in line with the best values reported in recent literature for similar structures. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
47
Issue :
6
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
129528533
Full Text :
https://doi.org/10.1007/s11664-017-5977-8