Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy.

MLA

Slobodian, Oleksandr M., et al. “Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy.” Nanoscale Research Letters, vol. 13, no. 1, May 2018, p. 1. EBSCOhost, https://doi.org/10.1186/s11671-018-2536-z.

APA

Slobodian, O. M., Lytvyn, P. M., Nikolenko, A. S., Naseka, V. M., Khyzhun, O. Y., Vasin, A. V., Sevostianov, S. V., & Nazarov, A. N. (2018). Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy. Nanoscale Research Letters, 13(1), 1. https://doi.org/10.1186/s11671-018-2536-z

Chicago

Slobodian, Oleksandr M., Peter M. Lytvyn, Andrii S. Nikolenko, Victor M. Naseka, Oleg Yu. Khyzhun, Andrey V. Vasin, Stanislav V. Sevostianov, and Alexei N. Nazarov. 2018. “Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy.” Nanoscale Research Letters 13 (1): 1. doi:10.1186/s11671-018-2536-z.