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Electron-stimulated reactions in nanoscale water films adsorbed on α-Al2O3(0001).

Authors :
Petrik, Nikolay G.
Kimmel, Greg A.
Source :
Physical Chemistry Chemical Physics (PCCP); 5/7/2018, Vol. 20 Issue 17, p11634-11642, 9p
Publication Year :
2018

Abstract

The radiation-induced decomposition and desorption of nanoscale amorphous solid water (D<subscript>2</subscript>O) films adsorbed on an α-Al<subscript>2</subscript>O<subscript>3</subscript>(0001) surface was studied at low temperature in ultrahigh vacuum using temperature programmed desorption (TPD) and electron stimulated desorption (ESD) with a mono-energetic, low energy electron source. ESD yields of molecular products (D<subscript>2</subscript>, O<subscript>2</subscript> and D<subscript>2</subscript>O) and the total sputtering yield increased with increasing D<subscript>2</subscript>O coverage up to ∼15 water monolayers (i.e.∼15 × 10<superscript>15</superscript> cm<superscript>−2</superscript>) to a coverage-independent level for thicker water films. Experiments with isotopically-layered water films (D<subscript>2</subscript>O and H<subscript>2</subscript>O) demonstrated that the highest water decomposition yields occurred at the interfaces of the nanoscale water films with the alumina substrate and vacuum. However, the increased reactivity of the water/alumina interface is relatively small compared to the enhancements in the non-thermal reactions previously observed at the water/Pt(111) and water/TiO<subscript>2</subscript>(110) interfaces. We propose that the relatively low activity of Al<subscript>2</subscript>O<subscript>3</subscript>(0001) for the radiation-induced production of molecular hydrogen is associated with lower reactivity of this surface with hydrogen atoms, which are likely precursors for the formation of molecular hydrogen. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14639076
Volume :
20
Issue :
17
Database :
Complementary Index
Journal :
Physical Chemistry Chemical Physics (PCCP)
Publication Type :
Academic Journal
Accession number :
129428019
Full Text :
https://doi.org/10.1039/c8cp01284a