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Asymptotically Optimal in Reliability Circuits in Two Bases Under Failures of 0 (<italic>k</italic> − 1) Type at the Outputs of Elements.

Authors :
Alekhina, M. A.
Barsukova, O. Yu.
Source :
Russian Mathematics; May2018, Vol. 62 Issue 5, p1-9, 9p
Publication Year :
2018

Abstract

We consider a problem of the realization of &lt;italic&gt;k&lt;/italic&gt;-valued logics functions (&lt;italic&gt;k&lt;/italic&gt; ≥ 3) by circuits in two bases: in the Rosser-Turkett basis and in its dual basis. We assume that the basis gates are exposed to faults at outputs: only of type 0 or only of type &lt;italic&gt;k&lt;/italic&gt; − 1, and they pass into faulty states independently of each other. We describe a constructive method for the synthesis of an asymptotically optimal reliable circuit for almost any function of &lt;italic&gt;k&lt;/italic&gt;-valued logic, we found the upper and lower bounds of circuits unreliability and the class of functions for which the lower bounds are true. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
1066369X
Volume :
62
Issue :
5
Database :
Complementary Index
Journal :
Russian Mathematics
Publication Type :
Academic Journal
Accession number :
129302287
Full Text :
https://doi.org/10.3103/S1066369X18050018