ELECTRICAL CHARACTERIZATION OF SiPM AS A FUNCTION OF TEST FREQUENCY AND TEMPERATURE.

Authors :: Boschini, M. J.
Consolandi, C.
Fallica, P. G.
Gervasi, M.
Grandi, D.
Mazzillo, M.
Pensotti, S.
Rancoita, P. G.
Sanfilippo, D.
Tacconi, M.
Valvo, G.
Source :: Astroparticle, Particle, Space Physics & Detectors For Physics Applications - Proceedings of the 13th Icatpp Conference; 2012, p663-675, 13p
Publication Year :: 2012

Subjects :: PHOTOMULTIPLIERS
ELECTRON tubes
PHOTONS
GEIGER-Muller counters
MAGNETIC field effects

Language :: English
ISBNs :: 9789814405065
Database :: Complementary Index
Journal :: Astroparticle, Particle, Space Physics & Detectors For Physics Applications - Proceedings of the 13th Icatpp Conference
Publication Type :: Conference
Accession number :: 129270518

Tools