GATE LEAKAGE CURRENT NOISE IN ULTRA-THIN GATE OXIDE MOSFET'S.

Subjects

Subjects :

CURRENT noise (Electricity)
STRAY currents
METAL oxide semiconductor field-effect transistors
LOW voltage systems
ENERGY dissipation

Details

Language :

English

ISBNs :

9789810246778

Database :

Complementary Index

Journal :

Noise in Physical Systems & 1/F Fluctuations: Icnf 2001, Procs of the 16th Intl Conf

Publication Type :

Conference

Accession number :

129194850