MEASUREMENTS OF THE HIGH FREQUENCY DRAIN NOISE CURRENTS IN SHORT-CHANNEL GaAs MESFETs AND Si MOSFETs.

Authors :: Lee, J. B.
La, O. G.
Min, H. S.
Park, Y. J.
Source :: Noise in Physical Systems & 1/F Fluctuations - Proceedings of the 13th International Conference; 1995, p410-413, 4p
Publication Year :: 1995

Subjects :: METAL semiconductor field-effect transistors
ELECTRONIC noise
GALLIUM arsenide
SILICON
METAL oxide semiconductor field-effect transistors
LOGIC circuits

Language :: English
ISBNs :: 9789810222789
Database :: Complementary Index
Journal :: Noise in Physical Systems & 1/F Fluctuations - Proceedings of the 13th International Conference
Publication Type :: Conference
Accession number :: 129189639

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