Suppression of Anomalously Large Threshold Voltage in Wafer-Bonded Vertical Transistors by Enhancing Critical Field to Impact Ionization.

MLA

Lal, Shalini, et al. “Suppression of Anomalously Large Threshold Voltage in Wafer-Bonded Vertical Transistors by Enhancing Critical Field to Impact Ionization.” IEEE Transactions on Electron Devices, vol. 65, no. 3, Mar. 2018, pp. 1079–86. EBSCOhost, https://doi.org/10.1109/TED.2018.2797046.

APA

Lal, S., Jing Lu, Thibeault, B. J., Man Hoi Wong, DenBaars, S. P., & Mishra, U. K. (2018). Suppression of Anomalously Large Threshold Voltage in Wafer-Bonded Vertical Transistors by Enhancing Critical Field to Impact Ionization. IEEE Transactions on Electron Devices, 65(3), 1079–1086. https://doi.org/10.1109/TED.2018.2797046

Chicago

Lal, Shalini, Jing Lu, Brian J. Thibeault, Man Hoi Wong, Steven P. DenBaars, and Umesh K. Mishra. 2018. “Suppression of Anomalously Large Threshold Voltage in Wafer-Bonded Vertical Transistors by Enhancing Critical Field to Impact Ionization.” IEEE Transactions on Electron Devices 65 (3): 1079–86. doi:10.1109/TED.2018.2797046.