First European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF. Tecnopolis (Bari), Italy 2-5 October 1990.

The First European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, was organized with the aim of offering an annual forum to the European researchers in the field of electron device reliability, where they can meet and discuss their common problems. The 1990 Conference was first planned as a meeting of Italian researchers engaged in the five-years project Materials and Devices for Solid-State Electronics (MADESS), of the National Research Council (CNR), but the interest of many European researchers, that met at the Technical Interest Group on IC Reliability under the CEC, and the encouragement of the CEC were the driving force to widen its purpose and begin a series of European conferences.