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Wafer-level micropackaging in thin film technology for RF MEMS applications.

Authors :
Persano, A.
Siciliano, P.
Quaranta, F.
Taurino, A.
Lucibello, A.
Marcelli, Romolo
Capoccia, G.
Proietti, E.
Bagolini, A.
Iannacci, J.
Source :
Microsystem Technologies; Jan2018, Vol. 24 Issue 1, p575-585, 11p
Publication Year :
2018

Abstract

In this work, a thin-film packaging was developed to be used for radio-frequency microelectromechanical system configurations. The fabricated packages are suspended membranes in the multilayer SiN/aSi/SiN on conductive coplanar waveguides (CPWs) of different length. Several geometric parameters of the membranes, which are the length, the curvature radius at the vertices of the rectangular base, the density and the diameter of holes on the capping surface, were also varied. The mechanical properties of the suspended membranes were investigated by mechanical simulations and surface profilometry measurements as a function of the geometric parameters. RF characterization was performed to evaluate the impact of the package on the CPW performance. Finally, network analysis was carried out, allowing to clarify the origin of the RF losses measured for the fabricated microdevices. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09467076
Volume :
24
Issue :
1
Database :
Complementary Index
Journal :
Microsystem Technologies
Publication Type :
Academic Journal
Accession number :
127551687
Full Text :
https://doi.org/10.1007/s00542-017-3583-6