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Spectral response characteristics of transmission-mode alkali telluride photocathodes working from vacuum-ultraviolet to ultraviolet band.

Authors :
Xiang Zhang
Yijun Zhang
Yunsheng Qian
Cheng Feng
Jingzhi Zhang
Yunlong Jiang
Zhiyun Pan
Source :
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov2017, Vol. 35 Issue 6, p1-6, 6p
Publication Year :
2017

Abstract

In order to characterize the spectral response of transmission-mode alkali telluride photocathodes, a spectral response measurement system for image intensifiers working from the vacuum-ultraviolet to ultraviolet band is developed. Using this system, the transmittance curves of usual window materials such as quartz, MgF<subscript>2</subscript>, and sapphire selected to prepare alkali telluride photocathodes are measured. In addition to the transmittance test function, the spectral response of image intensifiers based on transmission-mode alkali telluride photocathodes, such as Cs<subscript>2</subscript>Te, Rb<subscript>2</subscript>Te, Cs-K-Te, and Rb-K-Te photocathodes, under the excitation light from 115 to 400 nm is measured. The measured results show that the longwave cutoff wavelength of the Rb<subscript>2</subscript>Te photocathode is 313 nm, while that of the Cs<subscript>2</subscript>Te photocathode is 342 nm, which could be ascribed to the reduced cathode work function, inversely proportional to the atomic number of the alkali element in uni-alkali telluride photocathodes. Besides, the spectral response values of Cs-K-Te and Rb-K-Te photocathodes are greater than those of Cs<subscript>2</subscript>Te and Rb<subscript>2</subscript>Te photocathodes, and this case is similar to the multialkali effect of alkali antimonide photocathodes. The cutoff wavelength can get shorter through the combination with an additional K element. Compared with the Rb-K-Te photocathode with the shorter cutoff wavelength, the Cs-K-Te photocathode can achieve higher sensitivity. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21662746
Volume :
35
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics
Publication Type :
Academic Journal
Accession number :
126537232
Full Text :
https://doi.org/10.1116/1.5006049