Microstructure variations induced by excess PbX2 or AX within perovskite thin films.

We systematically investigated the impact of stoichiometric ratio variation between PbX₂ and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance. [ABSTRACT FROM AUTHOR]