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Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films.
- Source :
- Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p1600-1601, 2p, 1 Color Photograph, 1 Graph
- Publication Year :
- 2017
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 23
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 126001703
- Full Text :
- https://doi.org/10.1017/S1431927617008662