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The impact of charge compensated and uncompensated strontium defects on the stabilization of the ferroelectric phase in HfO2.

Authors :
Materlik, Robin
Künneth, Christopher
Mikolajick, Thomas
Kersch, Alfred
Source :
Applied Physics Letters; 8/21/2017, Vol. 111 Issue 8, p082902-1-082902-5, 5p, 2 Graphs
Publication Year :
2017

Abstract

Different dopants with their specific dopant concentration can be utilized to produce ferroelectric HfO<subscript>2</subscript> thin films. In this work, it is explored for Sr in a comprehensive first-principles study. Density functional calculations reveal structure, formation energy, and total energy of the Sr related defects in HfO<subscript>2</subscript>. We found the charge compensated defect with an associated oxygen vacancy Sr<subscript>Hf</subscript>V<subscript>O</subscript> to strongly favour the non-ferroelectric, tetragonal P4<subscript>2</subscript>/mnc phase energetically. In contrast, the uncompensated defect without oxygen vacancy Sr<subscript>Hf</subscript> favours the ferroelectric, orthorhombic Pca2<subscript>1</subscript> phase. According to the formation energy, the uncompensated defect can form easily under oxygen rich conditions in the production process. Low oxygen partial pressure existing over the lifetime promotes the loss of oxygen leading to V<subscript>O</subscript>, and thus, the destabilization of the ferroelectric, orthorhombic Pca2<subscript>1</subscript> phase is accompanied by an increase of the leakage current. This study attempts to fundamentally explain the stabilization of the ferroelectric, orthorhombic Pca2<subscript>1</subscript> phase by doping. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
111
Issue :
8
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
124836116
Full Text :
https://doi.org/10.1063/1.4993110