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Non-uniform ramping losses and thermal optimization with turn-to-turn resistivity grading in a (RE)Ba2Cu2Ox magnet consisting of multiple no-insulation pancake coils.

Authors :
Yawei Wang
Min Zhang
Weijia Yuan
Zhiyong Hong
Zhijian Jin
Honghai Song
Source :
Journal of Applied Physics; 2017, Vol. 122 Issue 5, p053902-1-053902-11, 11p, 1 Diagram, 1 Chart, 16 Graphs
Publication Year :
2017

Abstract

This paper presents a study on the ramping losses of a high temperature superconductor (HTS) magnet consisting of multiple no-insulation (NI) (RE)Ba<subscript>2</subscript>Cu<subscript>3</subscript>O<subscript>x</subscript> coils. The (RE)Ba<subscript>2</subscript>Cu<subscript>3</subscript>O<subscript>2</subscript> (REBCO) conductor is the second generation HTS thin tape, where RE stands for rare-earth. During a ramping operation of the NI HTS magnet, losses are generated both across turn-to-turn resistances and inside superconducting layers. The former comes with radial current, which is called “turn-to-turn loss;” the latter one is induced by flux creep and jump, called “magnetization loss.” The modeling and experimental studies on the ramping losses have been reported on single NI pancake coils in the previous part. In a HTS magnet consisting of multiple NI coils, the electromagnetic coupling between coils has a considerable influence on the distribution of ramping losses. Here, the experimentally validated model is used to investigate a HTS magnet consisting of 14 single pancake REBCO coils. The results show that both the turn-to-turn loss and the magnetization loss present a significant non-uniform distribution among the coils. The highest turn-to-turn loss occurs on the middle coils of the magnet, while the highest magnetization loss happens on the end coils. The nonuniform distribution of ramping losses can result in a considerable temperature difference among coils in the NI HTS magnet. It leads to an additional quench risk on the magnet and requires more attention in design. The distribution of the turn-to-to-turn loss can be optimized by adjusting the turn-to-turn resistivity. A much more uniform turn-to-turn loss distribution among coils is achieved by applying a graded turn-to-turn resistivity on the multiple coils. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
122
Issue :
5
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
124524816
Full Text :
https://doi.org/10.1063/1.4997738