Cite
Voltage, Throughput, Power, Reliability, and Multicore Scaling.
MLA
Xia, Fei, et al. “Voltage, Throughput, Power, Reliability, and Multicore Scaling.” Computer (00189162), vol. 50, no. 8, Aug. 2017, pp. 34–45. EBSCOhost, https://doi.org/10.1109/MC.2017.3001246.
APA
Xia, F., Rafiev, A., Aalsaud, A., Al-Hayanni, M., Davis, J., Levine, J., Mokhov, A., Romanovsky, A., Shafik, R., Yakovlev, A., & Yang, S. (2017). Voltage, Throughput, Power, Reliability, and Multicore Scaling. Computer (00189162), 50(8), 34–45. https://doi.org/10.1109/MC.2017.3001246
Chicago
Xia, Fei, Ashur Rafiev, Ali Aalsaud, Mohammed Al-Hayanni, James Davis, Joshua Levine, Andrey Mokhov, et al. 2017. “Voltage, Throughput, Power, Reliability, and Multicore Scaling.” Computer (00189162) 50 (8): 34–45. doi:10.1109/MC.2017.3001246.