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De-embedding method-based electrical resistivity characterisation scheme for a small brittle pillar-shaped material.

Authors :
Lee, J.
Kim, J.
Lim, S.-Y.
Kwon, J.-Y.
Im, J.
Lee, S.-M.
Moon, S. E.
Source :
Electronics Letters (Wiley-Blackwell); 7/6/2017, Vol. 53 Issue 14, p930-931, 2p, 3 Diagrams, 1 Graph
Publication Year :
2017

Abstract

An electrical resistivity evaluation method for a pillar-shaped solid material, especially a brittle thermoelectric Bi<subscript>2</subscript>Te<subscript>3</subscript>, is presented with short compensation based on a probing apparatus with four-spring pins. The method eliminates the process of modelling a complex contact resistance, resulting in a simple but reproducible characterisation without any contamination on the surface in comparison to either a conventional paste or welding contact. Furthermore, it enables a small electrical or thermoelectric material <2 mm thick to be appropriately evaluated, which can erect and align a pillar-shaped material with electrical terminals, in spite of a small surface area. To extract the resistivity of a Bi<subscript>2</subscript>Te<subscript>3</subscript> pillar with the volume of 2 x 2 x 1.6 mm, Alumina 6061-T6 material identical with that of Bi<subscript>2</subscript>Te<subscript>3</subscript> was used as a reference material for the short compensation. Thus, the modelled resistance and its resistivity were 2.46 ± 0.11 mΩ and 6.15 ± 0.28 Ω-µm, respectively, in the range of 2-10 kHz, demonstrating the validity of the method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00135194
Volume :
53
Issue :
14
Database :
Complementary Index
Journal :
Electronics Letters (Wiley-Blackwell)
Publication Type :
Academic Journal
Accession number :
123979412
Full Text :
https://doi.org/10.1049/el.2017.1508