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Fully Planar 4H-SiC Avalanche Photodiode With Low Breakdown Voltage.

Authors :
Sciuto, A.
Mazzillo, M.
Lenzi, P.
Di Franco, S.
Mello, D.
Barbarino, P. P.
Longo, G.
Cascino, S.
Santangelo, A.
Albergo, S.
Tricomi, A.
Starodubtsev, O.
Adriani, O.
D'Arrigo, G.
Source :
IEEE Sensors Journal; 7/15/2017, Vol. 17 Issue 14, p4460-4465, 6p
Publication Year :
2017

Abstract

We report on the structure and performance of 4H-SiC p+-n APDs fabricated in a fully planar technology. A dark current density lower than 10 nA/cm2 at 30-V reverse bias and a breakdown voltage of 88 V were observed. A gain as high as 105 was measured at 94-V reverse bias, confirming the avalanche multiplication working condition. The maximum responsivity value was measured at 270 nm, increasing from 0.06 A/W (QE = 29%) at 0-V bias to 0.10 A/W (QE of about 45%) at 30-V reverse bias. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
1530437X
Volume :
17
Issue :
14
Database :
Complementary Index
Journal :
IEEE Sensors Journal
Publication Type :
Academic Journal
Accession number :
123805480
Full Text :
https://doi.org/10.1109/JSEN.2017.2711643