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A frequency-modulated continuous-wave reflectometer for the Lithium Tokamak Experiment.

Authors :
Kubota, S.
Majeski, R.
Peebles, W. A.
Bell, R. E.
Boyle, D. P.
Kaita, R.
Kozub, T.
Lucia, M.
Merino, E.
Nguyen, X. V.
Rhodes, T. L.
Schmitt, J. C.
Source :
Review of Scientific Instruments; May2017, Vol. 88 Issue 5, p1-13, 13p
Publication Year :
2017

Abstract

The frequency-modulated continuous-wave reflectometer on LTX (Lithium Tokamak Experiment) and the data analysis methods used for determining electron density profiles are described. The diagnostic uses a frequency range of 13.1-33.5 GHz, for covering a density range of 0.21-1.4 x 10<superscript>13</superscript> cm<superscript>-3</superscript> (in O-mode polarization) with a time resolution down to 8 µs. The design of the diagnostic incorporates the concept of an "optimized" source frequency sweep, which minimizes the large variation in the intermediate frequency signal due to a long dispersive transmission line. The quality of the raw data is dictated by the tuning characteristics of the microwave sources, as well as the group delay ripple in the transmission lines, which can generate higher-order nonlinearities in the frequency sweep. Both effects are evaluated for our diagnostic and best practices are presented for minimizing "artifacts" generated in the signals. The quality of the reconstructed profiles is also improved using two additional data analysis methods. First, the reflectometer data are processed as a radar image, where clutter due to echoes from the wall and backscattering from density fluctuations can be easily identified and removed. Second, a weighed least-squares lamination algorithm POLAN (POLynomial ANalysis) is used to reconstruct the electron density profile. Examples of density profiles in LTX are presented, along with comparisons to measurements from the Thomson scattering and the λ = 1 mm interferometer diagnostics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
88
Issue :
5
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
123381349
Full Text :
https://doi.org/10.1063/1.4981811