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Strong Correlation Between Experiment and Simulation for Two-Photon Absorption Induced Carrier Generation.

Authors :
Hales, Joel M.
Roche, Nicolas J-H.
Khachatrian, Ani
Mcmorrow, Dale
Buchner, Stephen
Warner, Jeffrey
Turowski, Marek
Lilja, Klas
Hooten, Nicholas C.
Zhang, En Xia
Reed, Robert A.
Schrimpf, Ronald D.
Source :
IEEE Transactions on Nuclear Science; May2017, Vol. 64 Issue 5, p1133-1136, 4p
Publication Year :
2017

Abstract

This correspondence comments on the correlation between measured and simulated charge collection in two diode structures presented in <xref ref-type="bibr" rid="ref1">[1]</xref>. In <xref ref-type="bibr" rid="ref1">[1]</xref>, results from pulsed-laser-induced charge deposition via two-photon absorption revealed reasonable correlation between experimental data and simulations in some aspects but showed lack of correlation in terms of the measured and predicted magnitudes of the collected charge. The source of this poor agreement has recently been determined, and is attributed to an incorrect pulse energy calibration used for those experiments. With the proper energy calibration applied, the agreement between simulation and experiment is nearly quantitative for all observables in both devices. These results significantly strengthen the validity of the nonlinear optical beam propagation method numerical approach for accurately predicting pulsed-laser-induced charge deposition. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189499
Volume :
64
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
123183984
Full Text :
https://doi.org/10.1109/TNS.2017.2686010