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In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope.
- Source :
- Microscopy; Apr2017, Vol. 66 Issue 2, p143-153, 11p
- Publication Year :
- 2017
-
Abstract
- This paper reports the preliminary results of a new in-situ three-dimensional (3D) imaging system for observing plastic deformation behavior in a transmission electron microscope (TEM) as a directly relevant development of the recently reported straining-and-tomography holder [Sato K et al. (2015) Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. Microsc. 64: 369-375]. We designed an integrated system using the holder and newly developed straining and image-acquisition software and then developed an experimental procedure for in-situ straining and time-resolved electron tomography (ET) data acquisition. The software for image acquisition and 3D visualization was developed based on the commercially available ET software TEMography<superscript>TM</superscript>. We achieved time-resolved 3D visualization of nanometer-scale plastic deformation behavior in a Pb-Sn alloy sample, thus demonstrating the capability of this system for potential applications in materials science. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 20505698
- Volume :
- 66
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Microscopy
- Publication Type :
- Academic Journal
- Accession number :
- 122949230
- Full Text :
- https://doi.org/10.1093/jmicro/dfw109