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In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope.

Authors :
Hata, S.
Miyazaki, S.
Gondo, T.
Kawamoto, K.
Horii, N.
Sato, K.
Furukawa, H.
Kudo, H.
Miyazaki, H.
Murayama, M.
Source :
Microscopy; Apr2017, Vol. 66 Issue 2, p143-153, 11p
Publication Year :
2017

Abstract

This paper reports the preliminary results of a new in-situ three-dimensional (3D) imaging system for observing plastic deformation behavior in a transmission electron microscope (TEM) as a directly relevant development of the recently reported straining-and-tomography holder [Sato K et al. (2015) Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. Microsc. 64: 369-375]. We designed an integrated system using the holder and newly developed straining and image-acquisition software and then developed an experimental procedure for in-situ straining and time-resolved electron tomography (ET) data acquisition. The software for image acquisition and 3D visualization was developed based on the commercially available ET software TEMography<superscript>TM</superscript>. We achieved time-resolved 3D visualization of nanometer-scale plastic deformation behavior in a Pb-Sn alloy sample, thus demonstrating the capability of this system for potential applications in materials science. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20505698
Volume :
66
Issue :
2
Database :
Complementary Index
Journal :
Microscopy
Publication Type :
Academic Journal
Accession number :
122949230
Full Text :
https://doi.org/10.1093/jmicro/dfw109