Back to Search Start Over

Optical thin film inspection using parallel spectral domain optical coherence tomography.

Authors :
Muhammad Faizan Shirazi
Ruchire Eranga Wijesinghe
Ravichandran, Naresh Kumar
Pilun Kim
Jeon, Mansik
Jeehyun Kim
Source :
Proceedings of SPIE; 4/9/2017, Vol. 10323, p1-4, 4p
Publication Year :
2017

Details

Language :
English
ISSN :
0277786X
Volume :
10323
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
122809343
Full Text :
https://doi.org/10.1117/12.2267395