Reliability evaluation of high-performance, low-power FinFET standard cells based on mixed RBB/FBB technique.

Details

Language :

English

ISSN :

16744926

Volume :

38

Issue :

4

Database :

Complementary Index

Journal :

Journal of Semiconductors

Publication Type :

Academic Journal

Accession number :

122604832

Full Text :

https://doi.org/10.1088/1674-4926/38/4/044005