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Die and Package Level Thermal and Thermal/Moisture Stresses in 3D Packaging: Modeling and Characterization.

Authors :
Chen, Liangbiao
Jiang, Tengfei
Fan, Xuejun
Source :
3D Microelectronic Packaging; 2017, p293-332, 40p
Publication Year :
2017

Details

Language :
English
ISBNs :
9783319445847
Database :
Complementary Index
Journal :
3D Microelectronic Packaging
Publication Type :
Book
Accession number :
122108574
Full Text :
https://doi.org/10.1007/978-3-319-44586-1_12