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Die and Package Level Thermal and Thermal/Moisture Stresses in 3D Packaging: Modeling and Characterization.
- Source :
- 3D Microelectronic Packaging; 2017, p293-332, 40p
- Publication Year :
- 2017
Details
- Language :
- English
- ISBNs :
- 9783319445847
- Database :
- Complementary Index
- Journal :
- 3D Microelectronic Packaging
- Publication Type :
- Book
- Accession number :
- 122108574
- Full Text :
- https://doi.org/10.1007/978-3-319-44586-1_12