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Virtual Bulk Current Injection: Modeling EUT for Several Setups and Quantification of CM-to-DM Conversion.

Authors :
Cheaito, Hassan
Diop, Mor-Sokhna
Ali, Marwan
Clavel, Edith
Vollaire, Christian
Mutel, Leonce
Source :
IEEE Transactions on Electromagnetic Compatibility; Jun2017, Vol. 59 Issue 3, p835-844, 10p
Publication Year :
2017

Abstract

The use of a fixed forward power as obtained during the calibration phase in a bulk current injection test, without monitoring the current, may cause damage on the equipment under test (EUT) with low impedances. In this paper, an accurate EUT model has been designed based on impedance investigation. This model can be used to predict the conducted susceptibility of a generic EUT. The model is first based on black-box approach; then, an interaction model is added to provide flexibility of several geometric parameters, which can be changed from one setup to another. This methodology leads to the combined approach, which shows a satisfactory agreement between simulations and measurements. According to the developed equations, the impedance matrix of the described model can be readily switched to modal one. Afterward, asymmetric dummy EUTs were investigated and the analytical equations used to predict differential mode due to common-mode voltage injection were validated. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189375
Volume :
59
Issue :
3
Database :
Complementary Index
Journal :
IEEE Transactions on Electromagnetic Compatibility
Publication Type :
Academic Journal
Accession number :
122014179
Full Text :
https://doi.org/10.1109/TEMC.2016.2631721