Spectral profiling: Observer-effect-free profiling by monitoring EM emanations.

Authors :: Sehatbakhsh, Nader
Nazari, Alireza
Zajic, Alenka
Prvulovic, Milos
Source :: 2016 49th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO); 2016, p1-11, 11p
Publication Year :: 2016

Language :: English
ISBNs :: 9781509035083
Database :: Complementary Index
Journal :: 2016 49th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)
Publication Type :: Conference
Accession number :: 120856190
Full Text :: https://doi.org/10.1109/MICRO.2016.7783762