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Boolean Difference Based Reliability Evaluation of Fault-Tolerant Circuit Structures on FPGAs.

Authors :
Anwer, Jahanzeb
Platzner, Marco
Source :
2016 Euromicro Conference on Digital System Design (DSD); 2016, p1-8, 8p
Publication Year :
2016

Details

Language :
English
ISBNs :
9781509028177
Database :
Complementary Index
Journal :
2016 Euromicro Conference on Digital System Design (DSD)
Publication Type :
Conference
Accession number :
120193655
Full Text :
https://doi.org/10.1109/DSD.2016.35