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Influence of Carbon in Metalorganic Chemical Vapor Deposition of Few-Layer WSe Thin Films.

Authors :
Zhang, Xiaotian
Al Balushi, Zakaria
Zhang, Fu
Choudhury, Tanushree
Eichfeld, Sarah
Alem, Nasim
Jackson, Thomas
Robinson, Joshua
Redwing, Joan
Source :
Journal of Electronic Materials; Dec2016, Vol. 45 Issue 12, p6273-6279, 7p
Publication Year :
2016

Abstract

Metalorganic chemical vapor deposition (MOCVD) is a promising technique to form large-area, uniform films of monolayer or few-layer transition metal dichalcogenide (TMD) thin films; however, unintentional carbon incorporation is a concern. In this work, we report the presence of a defective graphene layer that forms simultaneously during MOCVD growth of tungsten diselenide (WSe) on sapphire at high growth temperature and high Se:W ratio when using tungsten hexacarbonyl (W(CO)) and dimethyl selenide ((CH)Se, DMSe) as precursors. The graphene layer alters the surface energy of the substrate reducing the lateral growth and coalescence of WSe domains. The use of hydrogen selenide (HSe) instead of DMSe eliminates the defective graphene layer enabling coalesced monolayer and few-layer WSe films. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
45
Issue :
12
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
119628699
Full Text :
https://doi.org/10.1007/s11664-016-5033-0