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Validations of calibration-free measurements of electron temperature using double-pass Thomson scattering diagnostics from theoretical and experimental aspects.
- Source :
- Review of Scientific Instruments; Sep2016, Vol. 87 Issue 9, p093502-1-093502-11, 11p, 1 Diagram, 1 Chart, 12 Graphs
- Publication Year :
- 2016
-
Abstract
- This paper evaluates the accuracy of electron temperature measurements and relative transmissivities of double-pass Thomson scattering diagnostics. The electron temperature (T<subscript>e</subscript>) is obtained from the ratio of signals from a double-pass scattering system, then relative transmissivities are calculated from the measured T<subscript>e</subscript> and intensity of the signals. How accurate the values are depends on the electron temperature (T<subscript>e</subscript>) and scattering angle (θ), and therefore the accuracy of the values was evaluated experimentally using the Large Helical Device (LHD) and the Tokyo spherical tokamak-2 (TST-2). Analyzing the data from the TST-2 indicates that a high T<subscript>e</subscript> and a large scattering angle (θ) yield accurate values. Indeed, the errors for scattering angle θ = 135° are approximately half of those for θ = 115°. The method of determining the T<subscript>e</subscript> in a wide Te range spanning over two orders of magnitude (0.01-1.5 keV) was validated using the experimental results of the LHD and TST-2. A simple method to provide relative transmissivities, which include inputs from collection optics, vacuum window, optical fibers, and polychromators, is also presented. The relative errors were less than approximately 10%. Numerical simulations also indicate that the T<subscript>e</subscript> measurements are valid under harsh radiation conditions. This method to obtain T<subscript>e</subscript> can be considered for the design of Thomson scattering systems where there is high-performance plasma that generates harsh radiation environments. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 87
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 118505932
- Full Text :
- https://doi.org/10.1063/1.4961476