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Indirect monitoring shot-to-shot shock waves strength reproducibility during pump–probe experiments.

Authors :
Pikuz, T. A.
Faenov, A. Ya.
Ozaki, N.
Hartley, N. J.
Albertazzi, B.
Matsuoka, T.
Takahashi, K.
Habara, H.
Tange, Y.
Matsuyama, S.
Yamauchi, K.
Ochante, R.
Sueda, K.
Sakata, O.
Sekine, T.
Sato, T.
Umeda, Y.
Inubushi, Y.
Yabuuchi, T.
Togashi, T.
Source :
Journal of Applied Physics; 2016, Vol. 120 Issue 3, p035901-1-035901-7, 7p, 1 Diagram, 1 Chart, 6 Graphs
Publication Year :
2016

Abstract

We present an indirect method of estimating the strength of a shock wave, allowing on line monitoring of its reproducibility in each laser shot. This method is based on a shot-to-shot measurement of the X-ray emission from the ablated plasma by a high resolution, spatially resolved focusing spectrometer. An optical pump laser with energy of 1.0 J and pulse duration of ∼660 ps was used to irradiate solid targets or foils with various thicknesses containing Oxygen, Aluminum, Iron, and Tantalum. The high sensitivity and resolving power of the X-ray spectrometer allowed spectra to be obtained on each laser shot and to control fluctuations of the spectral intensity emitted by different plasmas with an accuracy of ∼2%, implying an accuracy in the derived electron plasma temperature of 5%-10% in pump-probe high energy density science experiments. At nano- and sub-nanosecond duration of laser pulse with relatively low laser intensities and ratio Z/A∼0.5, the electron temperature follows T<subscript>e</subscript>∼I<subscript>las</subscript><superscript>2/3</superscript>. Thus, measurements of the electron plasma temperature allow indirect estimation of the laser flux on the target and control its shot-to-shot fluctuation. Knowing the laser flux intensity and its fluctuation gives us the possibility of monitoring shot-to-shot reproducibility of shock wave strength generation with high accuracy. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
120
Issue :
3
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
116951740
Full Text :
https://doi.org/10.1063/1.4958796