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Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers.
- Source :
- Structural Dynamics; 2016, Vol. 3 Issue 3, p1-10, 10p
- Publication Year :
- 2016
-
Abstract
- A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the "medium" energy regime (1-10?kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples. [ABSTRACT FROM AUTHOR]
- Subjects :
- ELECTRON diffraction
STRUCTURAL dynamics
MONOMOLECULAR films
Subjects
Details
- Language :
- English
- ISSN :
- 23297778
- Volume :
- 3
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Structural Dynamics
- Publication Type :
- Academic Journal
- Accession number :
- 116642103
- Full Text :
- https://doi.org/10.1063/1.4949538