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Reliability test for integrated Glass interposer.

Authors :
Ching-Kuan Lee
Jen-Chun Wang
Yu-Min Lin
Chau-Jie Zhan
Wen-Wei Shen
Huan-Chun Fu
Yuan-Chang Lee
Chia-Wen Chiang
Su-Ching Chung
Su-Mei Chen
Chia-Wen Fan
Hsiang-Hung Chang
Wei-Chung Lo
Yung Jean Lu
Source :
2016 International Conference on Electronics Packaging (ICEP); 2016, p48-51, 4p
Publication Year :
2016

Details

Language :
English
ISBNs :
9784904090176
Database :
Complementary Index
Journal :
2016 International Conference on Electronics Packaging (ICEP)
Publication Type :
Conference
Accession number :
116451509
Full Text :
https://doi.org/10.1109/ICEP.2016.7486780
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