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A digital processor architecture for combined EEG/EMG falling risk prediction.

Authors :
Annese, V. F.
Crepaldi, M.
Demarchi, D.
De Venuto, D.
Source :
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE); 2016, p714-719, 6p
Publication Year :
2016

Details

Language :
English
ISBNs :
9783981537079
Database :
Complementary Index
Journal :
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Publication Type :
Conference
Accession number :
116445164