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DESIGN AND IMPLEMENTATION OF SELF-TEST Using Verilog.

Authors :
KATHURIA, NIDHI
Source :
Electronics For You; Jun2016, Vol. 5 Issue 2, p105-108, 4p
Publication Year :
2016

Abstract

The article offers step-by-step instructions for designing a Memory built-in self-test (MBIST) for testing memory faults of a machine.

Subjects

Subjects :
COMPUTER storage capacity
COMPUTER storage devices
BUILT-in self tests (Engineering)

Details

Language :
English
ISSN :
0013516X
Volume :
5
Issue :
2
Database :
Complementary Index
Journal :
Electronics For You
Publication Type :
Periodical
Accession number :
116360214

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