Cite

Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.

MLA

Papavramidou, Panagiota, and Michael Nicolaidis. “Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.” IEEE Transactions on Computers, vol. 65, no. 7, July 2016, pp. 2284–98. EBSCOhost, https://doi.org/10.1109/TC.2015.2479618.



APA

Papavramidou, P., & Nicolaidis, M. (2016). Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS. IEEE Transactions on Computers, 65(7), 2284–2298. https://doi.org/10.1109/TC.2015.2479618



Chicago

Papavramidou, Panagiota, and Michael Nicolaidis. 2016. “Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.” IEEE Transactions on Computers 65 (7): 2284–98. doi:10.1109/TC.2015.2479618.