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Memristor and selector devices fabricated from HfO2–xNx.

Authors :
Murdoch, B. J.
McCulloch, D. G.
Ganesan, R.
McKenzie, D. R.
Bilek, M. M. M.
Partridge, J. G.
Source :
Applied Physics Letters; 4/4/2016, Vol. 108 Issue 14, p143504-1-143504-5, 5p, 4 Graphs
Publication Year :
2016

Abstract

Monoclinic HfO<subscript>2–x</subscript>N<subscript>x</subscript> has been incorporated into two-terminal devices exhibiting either memristor or selector operation depending on the controlled inclusion/suppression of mobile oxygen vacancies. In HfO<subscript>2</subscript> memristors containing oxygen vacancies, gradual conductance modulation, short-term plasticity, and long-term potentiation were observed using appropriate voltage-spike stimulation, suggesting suitability for artificial neural networks. Passivation of oxygen vacancies, confirmed by X-ray absorption spectroscopy, was achieved in HfO<subscript>2–x</subscript>N<subscript>x</subscript> films by the addition of nitrogen during growth. Selector devices formed on these films exhibited threshold switching and current controlled negative differential resistance consistent with thermally driven insulator to metal transitions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
108
Issue :
14
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
114435302
Full Text :
https://doi.org/10.1063/1.4945727